Web通知 下一步 ... ... WebOur new Archer™ 750 imaging-based overlay metrology system delivers the accuracy, precision and performance required during R&D, ramp and high volume manufacturing of …
KLA-Tencor Launches the Archer(TM) 300 LCM Overlay Metrology System
WebFeb 22, 2024 · With enhanced productivity, the Archer 600 supports increased sampling of overlay error for improved scanner corrections or identification of inline excursions. Multiple Archer 600 systems are already measuring the most advanced devices at foundry, logic and memory manufacturers worldwide. WebFeb 19, 2003 · Archer AIM is based on KLA-Tencor’s existing Archer platform. With a throughput greater than 150 300mm wafers per hour, Archer AIM provides a 25 percent … everyday canteen artarmon
KLA Tencor针对集成电路推出更先进的检测与检查系统106.42B-其 …
WebJun 22, 2010 · Statements in this press release other than historical facts, such as statements regarding Archer 300 LCM's expected performance, future developments and trends in the semiconductor industry and the anticipated challenges associated with them, expected uses of the Archer 300 LCM by KLA-Tencor's customers, the extendibility of the … WebJun 22, 2010 · KLA-Tencor Launches the Archer(TM) 300 LCM Overlay Metrology System New System Designed for Cost-Effective In-Line Monitoring and Scanner Qualification for … WebKLA’s software solutions for the semiconductor ecosystem centralize and analyze the data produced by inspection, metrology and process systems, and explore critical-feature designs and manufacturability of patterning technologies. Using advanced data analysis, modeling and visualization capabilities, our comprehensive suite of data analytics products support … everyday canvas tote bag